4. Characterization Techniques

Scanning Probe Methods — Quiz

Test your understanding of scanning probe methods with 5 practice questions.

Practice Questions

Question 1

Which of the following describes the fundamental principle behind the operation of a Scanning Tunneling Microscope (STM)?

Question 2

In which mode of Atomic Force Microscopy (AFM) does the tip intermittently touch the sample surface, reducing lateral forces and minimizing sample damage?

Question 3

What type of samples can be effectively imaged using Scanning Tunneling Microscopy (STM)?

Question 4

The tunneling current ($I$) in Scanning Tunneling Microscopy (STM) is exponentially dependent on the tip-sample distance ($d$). If the work function is $\Phi$ and $\kappa$ is a constant related to the electron decay length, which of the following expressions best represents this relationship?

Question 5

What is the primary purpose of the piezoelectric scanner in both Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM)?